A Novel ATPG Method for Capture Power Reduction during Scan Testing.

Xiaoqing Wen Seiji Kajihara Kohei Miyase Tatsuya Suzuki Kewal K. Saluja Laung-Terng Wang Kozo Kinoshita A Novel ATPG Method for Capture Power Reduction during Scan Testing. 1398-1405 2007 90-D IEICE Transactions 9 http://dx.doi.org/10.1093/ietisy/e90-d.9.1398 db/journals/ieicet/ieicet90d.html#WenKMSSWK07