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BibTeX record journals/ieicet/ParkS19
@article{DBLP:journals/ieicet/ParkS19, author = {Joong{-}Hyun Park and Myunghun Shin}, title = {Kink Suppression and High Reliability of Asymmetric Dual Channel Poly-Si Thin Film Transistors for High Voltage Bias Stress}, journal = {{IEICE} Trans. Electron.}, volume = {102-C}, number = {1}, pages = {95--98}, year = {2019}, url = {https://doi.org/10.1587/transele.E102.C.95}, doi = {10.1587/TRANSELE.E102.C.95}, timestamp = {Sat, 11 Apr 2020 14:47:48 +0200}, biburl = {https://dblp.org/rec/journals/ieicet/ParkS19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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