BibTeX record journals/ieicet/OoiCF07

download as .bib file

@article{DBLP:journals/ieicet/OoiCF07,
  author       = {Chia Yee Ooi and
                  Thomas Clouqueur and
                  Hideo Fujiwara},
  title        = {Analysis of Test Generation Complexity for Stuck-At and Path Delay
                  Faults Based on tau\({}^{\mbox{k}}\)-Notation},
  journal      = {{IEICE} Trans. Inf. Syst.},
  volume       = {90-D},
  number       = {8},
  pages        = {1202--1212},
  year         = {2007},
  url          = {https://doi.org/10.1093/ietisy/e90-d.8.1202},
  doi          = {10.1093/IETISY/E90-D.8.1202},
  timestamp    = {Sat, 11 Apr 2020 15:25:54 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/OoiCF07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.