Defect Level vs. Yield and Fault Coverage in the Presence of an Unreliable BIST.

Yoshiyuki Nakamura Jacob Savir Hideo Fujiwara Defect Level vs. Yield and Fault Coverage in the Presence of an Unreliable BIST. 1210-1216 2005 88-D IEICE Transactions 6 http://dx.doi.org/10.1093/ietisy/e88-d.6.1210 db/journals/ieicet/ieicet88d.html#NakamuraSF05