DBLP Record 'journals/ieicet/NakamuraSF05'

BibTeX

@article{DBLP:journals/ieicet/NakamuraSF05,
  author    = {Yoshiyuki Nakamura and
               Jacob Savir and
               Hideo Fujiwara},
  title     = {Defect Level vs. Yield and Fault Coverage in the Presence
               of an Unreliable BIST},
  journal   = {IEICE Transactions},
  volume    = {88-D},
  number    = {6},
  year      = {2005},
  pages     = {1210-1216},
  ee        = {http://dx.doi.org/10.1093/ietisy/e88-d.6.1210},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}