BibTeX record journals/ieicet/MurakamiMFAHM05

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@article{DBLP:journals/ieicet/MurakamiMFAHM05,
  author       = {Hideki Murakami and
                  Yoshikazu Moriwaki and
                  Masafumi Fujitake and
                  Daisuke Azuma and
                  Seiichiro Higashi and
                  Seiichi Miyazaki},
  title        = {Characterization of Atom Diffusion in Polycrystalline Si/SiGe/Si Stacked
                  Gate},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {88-C},
  number       = {4},
  pages        = {646--650},
  year         = {2005},
  url          = {https://doi.org/10.1093/ietele/e88-c.4.646},
  doi          = {10.1093/IETELE/E88-C.4.646},
  timestamp    = {Sat, 11 Apr 2020 14:47:46 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/MurakamiMFAHM05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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