BibTeX record journals/ieicet/MochizukiTSTU06

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@article{DBLP:journals/ieicet/MochizukiTSTU06,
  author       = {Kazuhiro Mochizuki and
                  Ken{-}ichi Tanaka and
                  Takashi Shiota and
                  Takafumi Taniguchi and
                  Hiroyuki Uchiyama},
  title        = {Effects of Rapid Thermal Annealing on Bias-Stress-Induced Base Leakage
                  in InGaP/GaAs Collector-Up Heterojunction Bipolar Transistors Fabricated
                  with {B} Ion Implantation},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {89-C},
  number       = {7},
  pages        = {943--948},
  year         = {2006},
  url          = {https://doi.org/10.1093/ietele/e89-c.7.943},
  doi          = {10.1093/IETELE/E89-C.7.943},
  timestamp    = {Sat, 11 Apr 2020 14:48:24 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/MochizukiTSTU06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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