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BibTeX record journals/ieicet/MichinishiYOKH04
@article{DBLP:journals/ieicet/MichinishiYOKH04, author = {Hiroyuki Michinishi and Tokumi Yokohira and Takuji Okamoto and Toshifumi Kobayashi and Tsutomu Hondo}, title = {{CMOS} Floating Gate Defect Detection Using Supply Current Test with {DC} Power Supply Superposed by {AC} Component}, journal = {{IEICE} Trans. Inf. Syst.}, volume = {87-D}, number = {3}, pages = {551--556}, year = {2004}, url = {http://search.ieice.org/bin/summary.php?id=e87-d\_3\_551}, timestamp = {Sat, 11 Apr 2020 15:26:36 +0200}, biburl = {https://dblp.org/rec/journals/ieicet/MichinishiYOKH04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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