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DBLP BibTeX Record 'journals/ieicet/LeeYSS08'

@article{DBLP:journals/ieicet/LeeYSS08,
  author    = {Hochul Lee and
               Youngchang Yoon and
               Ickhyun Song and
               Hyungcheol Shin},
  title     = {FN Stress Induced Degradation on Random Telegraph Signal
               Noise in Deep Submicron NMOSFETs},
  journal   = {IEICE Transactions},
  volume    = {91-C},
  number    = {5},
  year      = {2008},
  pages     = {776-779},
  ee        = {http://dx.doi.org/10.1093/ietele/e91-c.5.776},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}