<?xml version="1.0"?>
<dblp>
<article key="journals/ieicet/KobayashiMTHKRAI07" mdate="2008-01-22">
<author>Yusuke Kobayashi</author>
<author>C. Raghunathan Manoj</author>
<author>Kazuo Tsutsui</author>
<author>Venkanarayan Hariharan</author>
<author>Kuniyuki Kakushima</author>
<author>V. Ramgopal Rao</author>
<author>Parhat Ahmet</author>
<author>Hiroshi Iwai</author>
<title>Parasitic Effects in Multi-Gate MOSFETs.</title>
<pages>2051-2056</pages>
<year>2007</year>
<volume>90-C</volume>
<journal>IEICE Transactions</journal>
<number>10</number>
<ee>http://dx.doi.org/10.1093/ietele/e90-c.10.2051</ee>
<url>db/journals/ieicet/ieicet90c.html#KobayashiMTHKRAI07</url>
</article>
</dblp>
