A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters.

Kicheol Kim Youbean Kim Incheol Kim HyeonUk Son Sungho Kang A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. 670-672 2008 91-C IEICE Transactions 4 http://dx.doi.org/10.1093/ietele/e91-c.4.670 db/journals/ieicet/ieicet91c.html#KimKKSK08