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@article{DBLP:journals/ieicet/KimKKSK08,
author = {Kicheol Kim and
Youbean Kim and
Incheol Kim and
HyeonUk Son and
Sungho Kang},
title = {A Low-Cost BIST Based on Histogram Testing for Analog to
Digital Converters},
journal = {IEICE Transactions},
volume = {91-C},
number = {4},
year = {2008},
pages = {670-672},
ee = {http://dx.doi.org/10.1093/ietele/e91-c.4.670},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-09-16 by Michael Ley (ley@uni-trier.de)