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@article{DBLP:journals/ieicet/KimKKK08,
author = {Youbean Kim and
Kicheol Kim and
Incheol Kim and
Sungho Kang},
title = {A New Built-in Self Test Scheme for Phase-Locked Loops Using
Internal Digital Signals},
journal = {IEICE Transactions},
volume = {91-C},
number = {10},
year = {2008},
pages = {1713-1716},
ee = {http://dx.doi.org/10.1093/ietele/e91-c.10.1713},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2009-06-24 by Michael Ley (ley@uni-trier.de)