Shih-Yuan Huang Chi-Wu Mao Kuo-Sheng Cheng Contour-Based Window Extraction Algorithm for Bare Printed Circuit Board Inspection. 2802-2810 2005 88-D IEICE Transactions 12 http://dx.doi.org/10.1093/ietisy/e88-d.12.2802 db/journals/ieicet/ieicet88d.html#HuangMC05