Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time.

Yu Hu Yinhe Han Xiaowei Li Huawei Li Xiaoqing Wen Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time. 2616-2625 2006 89-D IEICE Transactions 10 http://dx.doi.org/10.1093/ietisy/e89-d.10.2616 db/journals/ieicet/ieicet89d.html#HuHLLW06