Yoshinobu Higami Kewal K. Saluja Hiroshi Takahashi Shin-ya Kobayashi Yuzo Takamatsu Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors. 3506-3513 2008 91-A IEICE Transactions 12 http://dx.doi.org/10.1093/ietfec/e91-a.12.3506 db/journals/ieicet/ieicet91a.html#HigamiSTKT08a