HigamiSTKT08'

BibTeX

@article{DBLP:journals/ieicet/HigamiSTKT08,
  author    = {Yoshinobu Higami and
               Kewal K. Saluja and
               Hiroshi Takahashi and
               Shin-ya Kobayashi and
               Yuzo Takamatsu},
  title     = {Fault Simulation and Test Generation for Transistor Shorts
               Using Stuck-at Test Tools},
  journal   = {IEICE Transactions},
  volume    = {91-D},
  number    = {3},
  year      = {2008},
  pages     = {690-699},
  ee        = {http://dx.doi.org/10.1093/ietisy/e91-d.3.690},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}