BibTeX record journals/ieiceee/ZhuBXHZZ20

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@article{DBLP:journals/ieiceee/ZhuBXHZZ20,
  author       = {Huilong Zhu and
                  Dawei Bi and
                  Xin Xie and
                  Zhiyuan Hu and
                  Zhengxuan Zhang and
                  Shichang Zou},
  title        = {Substrate effect on radiation-induced charge trapping in buried oxide
                  for partially-depleted {SOI} {NMOSFET}},
  journal      = {{IEICE} Electron. Express},
  volume       = {17},
  number       = {7},
  pages        = {20200001},
  year         = {2020},
  url          = {https://doi.org/10.1587/elex.17.20200001},
  doi          = {10.1587/ELEX.17.20200001},
  timestamp    = {Fri, 12 Feb 2021 22:20:20 +0100},
  biburl       = {https://dblp.org/rec/journals/ieiceee/ZhuBXHZZ20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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