@article{DBLP:journals/ieiceee/YuYXY05,
author = {Chuanzhao Yu and
Hong Yang and
Enjun Xiao and
J. S. Yuan},
title = {Voltage stress-induced performance degradation in NMOSFET
mixer},
journal = {IEICE Electronic Express},
volume = {2},
number = {5},
year = {2005},
pages = {133-137},
ee = {http://dx.doi.org/10.1587/elex.2.133},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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