BibTeX record journals/ieiceee/SongLHNS21

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@article{DBLP:journals/ieiceee/SongLHNS21,
  author       = {Tai Song and
                  Huaguo Liang and
                  Zhengfeng Huang and
                  Tianming Ni and
                  Ying Sun},
  title        = {Chip test pattern reordering method using adaptive test to reduce
                  cost for testing of ICs},
  journal      = {{IEICE} Electron. Express},
  volume       = {18},
  number       = {2},
  pages        = {20200420},
  year         = {2021},
  url          = {https://doi.org/10.1587/elex.17.20200420},
  doi          = {10.1587/ELEX.17.20200420},
  timestamp    = {Wed, 07 Dec 2022 23:02:49 +0100},
  biburl       = {https://dblp.org/rec/journals/ieiceee/SongLHNS21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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