On the fault tolerance of a clustered single-electron neural network for differential enhancement.

Takahide Oya Alexandre Schmid Tetsuya Asai Yusuf Leblebici Yoshihito Amemiya On the fault tolerance of a clustered single-electron neural network for differential enhancement. 76-80 2005 2 IEICE Electronic Express 3 http://dx.doi.org/10.1587/elex.2.76 db/journals/ieiceee/ieiceee2.html#OyaSALA05