BibTeX record journals/ieiceee/AbeYAN09

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@article{DBLP:journals/ieiceee/AbeYAN09,
  author       = {Yoshiteru Abe and
                  Shuichi Yanagi and
                  Shuichiro Asakawa and
                  Ryo Nagase},
  title        = {10-year reliability test results for {SC} connector installed on outside
                  plant},
  journal      = {{IEICE} Electron. Express},
  volume       = {6},
  number       = {8},
  pages        = {472--476},
  year         = {2009},
  url          = {https://doi.org/10.1587/elex.6.472},
  doi          = {10.1587/ELEX.6.472},
  timestamp    = {Fri, 12 Feb 2021 22:21:23 +0100},
  biburl       = {https://dblp.org/rec/journals/ieiceee/AbeYAN09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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