<?xml version="1.0"?>
<dblp>
<article key="journals/ibmrd/RiessRBBMS01" mdate="2003-05-16">
<author>Walter Riess</author>
<author>Heike Riel</author>
<author>Tilman Beierlein</author>
<author>Wolfgang Br&#252;tting</author>
<author>Peter M&#252;ller</author>
<author>Paul F. Seidler</author>
<title>Influence of trapped and interfacial charges in organic multilayer light-emitting devices.</title>
<pages>77-88</pages>
<year>2001</year>
<volume>45</volume>
<journal>IBM Journal of Research and Development</journal>
<number>1</number>
<ee>http://www.research.ibm.com/journal/rd/451/riess.html</ee>
<url>db/journals/ibmrd/ibmrd45.html#RiessRBBMS01</url>
</article>
</dblp>
