BibTeX record journals/ibmrd/ColganPTW98

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@article{DBLP:journals/ibmrd/ColganPTW98,
  author       = {Evan G. Colgan and
                  Robert J. Polastre and
                  Masatomo Takeichi and
                  Robert L. Wisnieff},
  title        = {Thin-film-transistor process-characterization test structures},
  journal      = {{IBM} J. Res. Dev.},
  volume       = {42},
  number       = {3},
  pages        = {481--490},
  year         = {1998},
  url          = {https://doi.org/10.1147/rd.423.0481},
  doi          = {10.1147/RD.423.0481},
  timestamp    = {Fri, 13 Mar 2020 10:54:43 +0100},
  biburl       = {https://dblp.org/rec/journals/ibmrd/ColganPTW98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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