<?xml version="1.0"?>
<dblp>
<article key="journals/ibmrd/BuddDSMFW97" mdate="2008-08-18">
<author>Russell A. Budd</author>
<author>Derek B. Dove</author>
<author>John L. Staples</author>
<author>Ronald M. Martino</author>
<author>Richard A. Ferguson</author>
<author>J. Tracy Weed</author>
<title>Development and application of a new tool for lithographic mask evaluation, the stepper equivalent Aerial Image Measurement System, AIMS.</title>
<pages>119-130</pages>
<year>1997</year>
<volume>41</volume>
<journal>IBM Journal of Research and Development</journal>
<number>1&amp;2</number>
<ee>http://dx.doi.org/10.1147/rd.411.0119</ee>
<url>db/journals/ibmrd/ibmrd41.html#BuddDSMFW97</url>
</article>
</dblp>
