BibTeX record journals/iacr/ShakevskyRW22

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@article{DBLP:journals/iacr/ShakevskyRW22,
  author       = {Alon Shakevsky and
                  Eyal Ronen and
                  Avishai Wool},
  title        = {Trust Dies in Darkness: Shedding Light on Samsung's TrustZone Keymaster
                  Design},
  journal      = {{IACR} Cryptol. ePrint Arch.},
  pages        = {208},
  year         = {2022},
  url          = {https://eprint.iacr.org/2022/208},
  timestamp    = {Tue, 22 Mar 2022 16:32:06 +0100},
  biburl       = {https://dblp.org/rec/journals/iacr/ShakevskyRW22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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