BibTeX record journals/et/ZhangMP93

download as .bib file

@article{DBLP:journals/et/ZhangMP93,
  author       = {Zaifu Zhang and
                  Robert D. McLeod and
                  Witold Pedrycz},
  title        = {A neural network algorithm for testing stuck-open faults in {CMOS}
                  combinational circuits},
  journal      = {J. Electron. Test.},
  volume       = {4},
  number       = {3},
  pages        = {225--235},
  year         = {1993},
  url          = {https://doi.org/10.1007/BF00971972},
  doi          = {10.1007/BF00971972},
  timestamp    = {Fri, 11 Sep 2020 15:03:15 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ZhangMP93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.