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BibTeX record journals/et/YuWX20
@article{DBLP:journals/et/YuWX20, author = {Dongzhe Yu and Han Wang and Jiangtao Xu}, title = {Impact of Worst-Case Excitation for {DDR} interface Signal and Power Integrity Co-Simulation}, journal = {J. Electron. Test.}, volume = {36}, number = {3}, pages = {365--374}, year = {2020}, url = {https://doi.org/10.1007/s10836-020-05875-4}, doi = {10.1007/S10836-020-05875-4}, timestamp = {Fri, 11 Sep 2020 15:02:57 +0200}, biburl = {https://dblp.org/rec/journals/et/YuWX20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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