BibTeX record journals/et/YehC19

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@article{DBLP:journals/et/YehC19,
  author       = {Chung{-}Huang Yeh and
                  Jwu E. Chen},
  title        = {Repeated Testing Applications for Improving the {IC} Test Quality
                  to Achieve Zero Defect Product Requirements},
  journal      = {J. Electron. Test.},
  volume       = {35},
  number       = {4},
  pages        = {459--472},
  year         = {2019},
  url          = {https://doi.org/10.1007/s10836-019-05812-0},
  doi          = {10.1007/S10836-019-05812-0},
  timestamp    = {Fri, 11 Sep 2020 15:03:21 +0200},
  biburl       = {https://dblp.org/rec/journals/et/YehC19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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