Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing.

Xiaoqing Wen Kohei Miyase Tatsuya Suzuki Seiji Kajihara Laung-Terng Wang Kewal K. Saluja Kozo Kinoshita Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing. 379-391 2008 24 J. Electronic Testing 4 http://dx.doi.org/10.1007/s10836-007-5033-3 db/journals/et/et24.html#WenMSKWSK08