BibTeX record journals/et/WenMSKWSK08

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@article{DBLP:journals/et/WenMSKWSK08,
  author       = {Xiaoqing Wen and
                  Kohei Miyase and
                  Tatsuya Suzuki and
                  Seiji Kajihara and
                  Laung{-}Terng Wang and
                  Kewal K. Saluja and
                  Kozo Kinoshita},
  title        = {Low Capture Switching Activity Test Generation for Reducing IR-Drop
                  in At-Speed Scan Testing},
  journal      = {J. Electron. Test.},
  volume       = {24},
  number       = {4},
  pages        = {379--391},
  year         = {2008},
  url          = {https://doi.org/10.1007/s10836-007-5033-3},
  doi          = {10.1007/S10836-007-5033-3},
  timestamp    = {Fri, 11 Sep 2020 15:02:26 +0200},
  biburl       = {https://dblp.org/rec/journals/et/WenMSKWSK08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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