BibTeX
@article{DBLP:journals/et/WenMSKWSK08,
author = {Xiaoqing Wen and
Kohei Miyase and
Tatsuya Suzuki and
Seiji Kajihara and
Laung-Terng Wang and
Kewal K. Saluja and
Kozo Kinoshita},
title = {Low Capture Switching Activity Test Generation for Reducing
IR-Drop in At-Speed Scan Testing},
journal = {J. Electronic Testing},
volume = {24},
number = {4},
year = {2008},
pages = {379-391},
ee = {http://dx.doi.org/10.1007/s10836-007-5033-3},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2009-03-22 by Michael Ley (ley@uni-trier.de)