A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices.

Baosheng Wang Andy Kuo Touraj Farahmand André Ivanov Yong B. Cho Sassan Tabatabaei A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices. 621-630 2005 21 J. Electronic Testing 6 http://dx.doi.org/10.1007/s10836-005-4819-4 db/journals/et/et21.html#WangKFICT05