![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
BibTeX record journals/et/Vaaje06
@article{DBLP:journals/et/Vaaje06, author = {Audhild Vaaje}, title = {Theorems for Fault Collapsing in Combinational Circuits}, journal = {J. Electron. Test.}, volume = {22}, number = {1}, pages = {23--36}, year = {2006}, url = {https://doi.org/10.1007/s10836-006-6222-1}, doi = {10.1007/S10836-006-6222-1}, timestamp = {Fri, 11 Sep 2020 15:03:06 +0200}, biburl = {https://dblp.org/rec/journals/et/Vaaje06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.