ShethS04'

BibTeX

@article{DBLP:journals/et/ShethS04,
  author    = {Amit M. Sheth and
               Jacob Savir},
  title     = {Scan Latch Design for Test Applications},
  journal   = {J. Electronic Testing},
  volume    = {20},
  number    = {2},
  year      = {2004},
  pages     = {213-216},
  ee        = {http://dx.doi.org/10.1023/B:JETT.0000023683.62501.ed},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}