Peter Sandborn Rajarshi Ghosh Ken Drake Magdy S. Abadir Linda Bal Ashish Parikh Multichip systems trade-off analysis tool. 207-218 1994 5 J. Electronic Testing 2-3 http://dx.doi.org/10.1007/BF00972080 db/journals/et/et5.html#SandbornGDABP94