A Novel RF Test Scheme Based on a DFT Method.

Jee-Youl Ryu Bruce C. Kim Iboun Taimiya Sylla A Novel RF Test Scheme Based on a DFT Method. 229-237 2006 22 J. Electronic Testing 3 http://dx.doi.org/10.1007/s10836-006-7823-4 db/journals/et/et22.html#RyuKS06