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@article{DBLP:journals/et/RyuKS06,
author = {Jee-Youl Ryu and
Bruce C. Kim and
Iboun Taimiya Sylla},
title = {A Novel RF Test Scheme Based on a DFT Method},
journal = {J. Electronic Testing},
volume = {22},
number = {3},
year = {2006},
pages = {229-237},
ee = {http://dx.doi.org/10.1007/s10836-006-7823-4},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-09-18 by Michael Ley (ley@uni-trier.de)