BibTeX record journals/et/RuizFGM12

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@article{DBLP:journals/et/RuizFGM12,
  author       = {Jose Mar{\'{\i}}a Ru{\'{\i}}z and
                  Ra{\'{u}}l Fern{\'{a}}ndez{-}Garc{\'{\i}}a and
                  Ignacio Gil and
                  Marta Morata},
  title        = {Current Consumption and Power Integrity of {CMOS} Digital Circuits
                  Under {NBTI} Wearout},
  journal      = {J. Electron. Test.},
  volume       = {28},
  number       = {6},
  pages        = {865--868},
  year         = {2012},
  url          = {https://doi.org/10.1007/s10836-012-5337-9},
  doi          = {10.1007/S10836-012-5337-9},
  timestamp    = {Fri, 11 Sep 2020 15:03:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/RuizFGM12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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