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BibTeX record journals/et/RuizFGM12
@article{DBLP:journals/et/RuizFGM12, author = {Jose Mar{\'{\i}}a Ru{\'{\i}}z and Ra{\'{u}}l Fern{\'{a}}ndez{-}Garc{\'{\i}}a and Ignacio Gil and Marta Morata}, title = {Current Consumption and Power Integrity of {CMOS} Digital Circuits Under {NBTI} Wearout}, journal = {J. Electron. Test.}, volume = {28}, number = {6}, pages = {865--868}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5337-9}, doi = {10.1007/S10836-012-5337-9}, timestamp = {Fri, 11 Sep 2020 15:03:00 +0200}, biburl = {https://dblp.org/rec/journals/et/RuizFGM12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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