BibTeX record journals/et/RaikU00

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@article{DBLP:journals/et/RaikU00,
  author       = {Jaan Raik and
                  Raimund Ubar},
  title        = {Fast Test Pattern Generation for Sequential Circuits Using Decision
                  Diagram Representations},
  journal      = {J. Electron. Test.},
  volume       = {16},
  number       = {3},
  pages        = {213--226},
  year         = {2000},
  url          = {https://doi.org/10.1023/A:1008335130158},
  doi          = {10.1023/A:1008335130158},
  timestamp    = {Mon, 26 Oct 2020 08:48:44 +0100},
  biburl       = {https://dblp.org/rec/journals/et/RaikU00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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