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BibTeX record journals/et/PoehlA99
@article{DBLP:journals/et/PoehlA99, author = {Frank Poehl and Walter Anheier}, title = {Quality Determination for Gate Delay Fault Tests Considering Three-State Elements}, journal = {J. Electron. Test.}, volume = {14}, number = {1-2}, pages = {49--55}, year = {1999}, url = {https://doi.org/10.1023/A:1008345221488}, doi = {10.1023/A:1008345221488}, timestamp = {Fri, 11 Sep 2020 15:03:10 +0200}, biburl = {https://dblp.org/rec/journals/et/PoehlA99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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