BibTeX record journals/et/OoiF11

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@article{DBLP:journals/et/OoiF11,
  author       = {Chia Yee Ooi and
                  Hideo Fujiwara},
  title        = {A New Design-for-Testability Method Based on Thru-Testability},
  journal      = {J. Electron. Test.},
  volume       = {27},
  number       = {5},
  pages        = {583--598},
  year         = {2011},
  url          = {https://doi.org/10.1007/s10836-011-5241-8},
  doi          = {10.1007/S10836-011-5241-8},
  timestamp    = {Fri, 11 Sep 2020 15:02:40 +0200},
  biburl       = {https://dblp.org/rec/journals/et/OoiF11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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