@article{DBLP:journals/et/NovakPNHGG04,
author = {Ondrej Nov{\'a}k and
Zdenek Pl\'{\i}va and
Jiri Nosek and
Andrzej Hlawiczka and
Tomasz Garbolino and
Krzysztof Gucwa},
title = {Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns
and Zero-Aliasing Compactor},
journal = {J. Electronic Testing},
volume = {20},
number = {1},
year = {2004},
pages = {109-122},
ee = {http://dx.doi.org/10.1023/B:JETT.0000009317.31947.c8},
bibsource = {DBLP, http://dblp.uni-trier.de}
}