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@article{DBLP:journals/et/NagvajaraLNW97,
author = {Prawat Nagvajara and
J. Lin and
P. Nilagupta and
C. Wang},
title = {Multichip Module Diagnosis by Product-Code Signatures},
journal = {J. Electronic Testing},
volume = {10},
number = {1-2},
year = {1997},
pages = {127-136},
ee = {http://dx.doi.org/10.1023/A:1008234917747},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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