<?xml version="1.0"?>
<dblp>
<article key="journals/et/LoLCLL03" mdate="2009-03-22">
<author>Hao-Yung Lo</author>
<author>Hsiu-Feng Lin</author>
<author>Chichyang Chen</author>
<author>Jenshiuh Liu</author>
<author>Chia-Cheng Liu</author>
<title>Built-in Test with Modified-Booth High-Speed Pipelined Multipliers and Dividers.</title>
<pages>245-269</pages>
<year>2003</year>
<volume>19</volume>
<journal>J. Electronic Testing</journal>
<number>3</number>
<ee>http://dx.doi.org/10.1023/A:1023792812521</ee>
<url>db/journals/et/et19.html#LoLCLL03</url>
</article>
</dblp>
