Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.

Huaguo Liang Sybille Hellebrand Hans-Joachim Wunderlich Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. 159-170 2002 18 J. Electronic Testing 2 http://dx.doi.org/10.1023/A:1014993509806 db/journals/et/et18.html#LiangHW02