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@article{DBLP:journals/et/KimKH08,
author = {Hong-Sik Kim and
Sungho Kang and
Michael S. Hsiao},
title = {A New Scan Architecture for Both Low Power Testing and Test
Volume Compression Under SOC Test Environment},
journal = {J. Electronic Testing},
volume = {24},
number = {4},
year = {2008},
pages = {365-378},
ee = {http://dx.doi.org/10.1007/s10836-008-5062-6},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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