Defect-tolerant Logic with Nanoscale Crossbar Circuits.

Tad Hogg Greg Snider Defect-tolerant Logic with Nanoscale Crossbar Circuits. 117-129 2007 23 J. Electronic Testing 2-3 http://dx.doi.org/10.1007/s10836-006-0547-7 db/journals/et/et23.html#HoggS07