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@article{DBLP:journals/et/HoggS07,
author = {Tad Hogg and
Greg Snider},
title = {Defect-tolerant Logic with Nanoscale Crossbar Circuits},
journal = {J. Electronic Testing},
volume = {23},
number = {2-3},
year = {2007},
pages = {117-129},
ee = {http://dx.doi.org/10.1007/s10836-006-0547-7},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-09-18 by Michael Ley (ley@uni-trier.de)