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DBLP Record 'journals/et/HoggS07'

BibTeX

@article{DBLP:journals/et/HoggS07,
  author    = {Tad Hogg and
               Greg Snider},
  title     = {Defect-tolerant Logic with Nanoscale Crossbar Circuits},
  journal   = {J. Electronic Testing},
  volume    = {23},
  number    = {2-3},
  year      = {2007},
  pages     = {117-129},
  ee        = {http://dx.doi.org/10.1007/s10836-006-0547-7},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2007-09-18 by Michael Ley (ley@uni-trier.de)