Sybille Hellebrand Huaguo Liang Hans-Joachim Wunderlich A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. 341-349 2001 17 J. Electronic Testing 3-4 http://dx.doi.org/10.1023/A:1012279716236 db/journals/et/et17.html#HellebrandLW01