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@article{DBLP:journals/et/HaiderK93,
author = {Nazar S. Haider and
Nick Kanopoulos},
title = {Efficient board interconnect testing using the split boundary
scan register},
journal = {J. Electronic Testing},
volume = {4},
number = {2},
year = {1993},
pages = {181-189},
ee = {http://dx.doi.org/10.1007/BF00971646},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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